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    • 簡介:Y953717梗旦大學碩士學位論文專業(yè)學位035UM工藝單層多晶硅OTP存儲器研發(fā)院系信息科學與工程學院專姓指導業(yè)名教師完成日期電子與通信工程夏春新李蔚黃河博士2005年9月27日學校代碼學號10246043021173ABSTRACTONEPOLYOTPMEMORYISONEKINDOFTHENONVOLATILEMEMORYNVMDEVICESANDHASBEENDEVELOPEDRAPIDLYSINCEITWASINVITED.SINCEITHASSIMPLESTRUCTUREANDSTABLECHARACTERISTIC,ONEPOLYOTPMEMORYISUSEDINMANYAPPLICATIONSFOREXAMPLEMCU,LCDDIVER.ETC.THEDATASTORAGEINOTPMEMORYRELIESTOTHEFLOATINGGATE.HOWEVER,IT’SDIFFERENTTOOTHERFLOATINGGATEDEVICEFLASHEEPROMTHATITSMEMORYCELLISCOMPOSEDOFACAPACITANCEANDANTYPEMOSFET.THECAPACITANCEWHICHISCOMPOSEDOFTHEFLOATINGGATE,GATEOXIDEANDNWELLCONTROLSTHEPOTENTIAL,INTHEFLOATINGGATEANDTHEN.TYPETRANSISTORISUSEDTOREADANDWRITETHEDATAINTHEDEVICE.INTHEPASTMONTHS,TWOKINDSOFOTPMEMORYDEVICESWEREDEVELOPEDWHICHHAVETWODIFFERENTGATEOXIDETHICKNESS.DIFFERENTTESTKEYSWEREDEVELOPEDINMANYDEVICESIZE.THENWAFERSWERESTARTEDTOVERIFYTHEDESIGNANDDEVICEFUNCTIONSINSMIC0.35URNHI曲VOLTAGEPROCESS.THETESTDATASHOWSTHATTHESETWOOTPMEMORYCELLSHASOUTSTANDINGDATARETENTIONANDRAPIDWRITEANDREADSPEED.THEDATAERASEEARLBEIMPLEMENTEDBYUVIRRADIATION.THEYCANMEETTHEREQUIREMENTOFTHELOWDENSITYNVMINTHEAPPLICATIONS.ATLAST,THERE’SSOMEDISCUSSABOUTTHEPOSSIBILITYOFMULTIELECTRONICERASEONEPOLYNVMDEVICE.KEYWORDSOTP;FLOATINGGATE
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    • 簡介:Y1404996分類號UDCTG457.1L密級學校代號10150學號20052147戈建交通戈乎碩士學位論文0.5MMCD2鎘板脈沖TIG點焊及重熔補焊工藝研究RESEARCHONPULSETIGSPOTWELDINGANDREPAIRWELDINGTECHNOLOGYFOR0.5MMTHICKCD一2PLATE學生姓名導師及職稱學科門類專業(yè)名稱研究方向申請學位級別論文答辯日期學位授予單位鐘春雷譚文一教授工學材料加工工程特種材料焊接碩士2008年6月6日大連交通大學大連交通大學工學碩士學位論文ABSTRACTTHENUCLEARFUELHASBEENUSEDBYTHENUCLEARPOWERSTATION,WHICHISCALLEDTHESPENTFUEL.THESPENTFUELWILLPRODUCEVERYSTRONGNUCLEARRADIATIONBECAUSEOFTHEIRMUTUALRELEASINGNEUTRONSBRINGINGACHAINNUCLEARFISSIONREACTIONWHENTHEYARESTACKEDTOGETHER.CADMIUMASAGOODABSORBINGNEUTRONMATERIALSISAPPLIEDONTHEMANUFACTUREOFSTOCKPILEFRAME.WHICHISAMAINEQUIPMENTUSEDTODISPOSETHESPENTFUEL.THESPENTFUELFRAMESLEEVEISATHREE.1AYERSTRUCTURE.WHICHISCOMPOSEDOF2MMINNERCIRCULARPIPE,0.8MMOUTERCIRCULARPIPEANDCADMIUMSLEEVEWELDEDBY0.5MMCADMIUMPLATECD2、INTHEMIDDLEOFINNERANDOUTERCIRCULARSLEEVE.BECAUSEOFLOWMELTINGPOINTANDOXIDIZABLEPROPERTYOFCADMIUM.THEWELDINGOFCADMIUMPLATECD一2HASBEENBEINGADIFFICULTPROBLEMINTHEPROCESSOFMANUFACTUREOFTHESPENTFUELFRAMESLEEVE.TILISPAPERSTUDIESTHEWELDINGQUALITIESOFPULSETIGSPOTWELDINGANDREMELTINGREPAIRWELDINGTECHNOLOGYOF0.5MMCADMIUMCD2PLATEUSINGDIFFERENTWELDINGPROCESSPARAMETERS,INCLUDINGPULSECURRENT,WELDINGTIME,ARCLENGTHANDSHIELDGASFLOWRATE,THROUGHWELDINGTEST,MECHANICALTEST,MICROSTRUCTUREANALYSISANDNEUTRONFLUXTEST。功E括STRESULTSSHOWWELDINGTIMETPSHALLBEREDUCEDWHENPULSECURRENTIPISHIGHER,WELDINGTIMETPSHALLBEINCREASEDWHENPULSECURRENTIPISLOWER.THETUNGSTICELECTRODENECK.INSHALLBE5MM~6MM.ANDARGONFLOWRATESHALLBE34L/MIN.WITHTHEINCREASEOFTHEPULSECURRENTANDWELDINGTIME,THESHEARINGRESISTANTFORCEANDWELDINGSPOTDIAMETERD2WILLALSOINCREASE.TLLETORSIONFORMOFFRACTUREINDICATESTHEFORCETHEWELDINGJOINTRECEIVESISPULL.CUTCOMPOUNDSTRENGTH.11LEFRACTUREANALYSISSHOWSTHEMORPHOLOGYOFTHEFRACTUREISDIMPLESQUASI.CLEAVAGEMIXEDFRACTURE.ANDTHEFRACTURELOCATIONISINTHEHEAT.AFFECTEDZONE.NLEGRAINMICROSTRUCTUREOF0.5MMCADMIUMCD2BASEPLATEPRESENTSHEXAGONALSHAPE,WHICHCONFORMSTOTHEFACTTHATCADMIUMSHALLBEHEXAGONALLATTICESTRUCTURE.111ESTRUCTUREOFWELDINGJOINTOFO.5MMCADMIUMCD一2PLATEPRESENTSAPPROXIMATECOLUMNATECRYSTALGRAINORGANIZATION.THEINCREASEOFTHEPULSECURRENTANDWELDINGTIMEWILLMAKECRYSTALGRAINSIZEINCREASE.ANDCADMIUMRATIOVALUEREDWILLINCREASEALONGWITHTHEREDUCTIONOFCRYSTALGRAINSIZE.SO10WERCURRENTANDSHORTWELDINGTIMESHALLBESELECTED.,NLEFOLLOWINGWELDINGPROCESSPARAMETERSARERECOMMENDEDPULSECURRENTIP8A,WELDTIMET23S,TUNGSTICELECTRODENECKIN5MM,ARGONFLOWRATE3.5L/MIN.THETESTRESULTSSHOWTHEWELDINGPROCESSPARAMETERUSEDINTHESPOTWELDINGCANALSOBEAPPLIEDTOREMELTINGREPAIRWELDING.THEMICROSTRUCTUREOFWELDSEAMINDICATESCRYSTALGRAINGROWSCOARSER.BUTWHICHISFMERTHANSPOTWELDING.THEANALYSISCONFIRMSTHEINCREASEOFNUCLEATIONRATEANDTHESLOWEROFCRYSTALGRAINGROWTHVELOCITYARETHEMAINREASONOFTHISPHENOMENON.KEYWORDSCADMIUMPLATE;PULSEDTIGSPOTWELDING;MIEROSTRUETURE;TENSILE;NEUTRONFLUXIL
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    • 簡介:072833庶東南大學工程碩士學位論文0.35JJLMCMOS工藝3.125GB/S低電壓116分接器設計研究生姓名杜塞俊導師姓名迢至數(shù)援申請學位級別工程亟±.論文提交日期壘QQ生月旦學位授予單位丕直太堂答辯委員會主席廷塞直工工程領域名稱筮仕王程IG友囪2論文答辯日期至QQ生魚旦Z旦學位授予日期壘QQ生月旦評閱人任塞矗王奎蟹登麴援.2010年6月8日0.351AMCMOS3.125GB/SLOWVOLTAGE116DEMUXDESIGNATHESISSUBMITTEDTOSOUTHEASTUNIVERSITYFORTHEACADEMICDEGREEOFMASTEROFENGINEERINGBYDUWENJUNSUPERVISEDBYPROFESSORFENGJUNANDSENIORENGINEERXIEZHENGZHONGSCHOOLOFINTEGRATEDCIRCUITSSOUTHEASTUNIVERSITYJUNE2010
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      上傳時間:2024-03-12
      頁數(shù): 86
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    • 簡介:中國近代第一所大學FOUNDEDIN1895天率大薯TLANJINUNLVERSLTY碩士學位論文學科專業(yè)作者姓名指導教師微電子學與國體電子學王修遠毛陸虹教授天津大學研究生院2006年1月ABSTRACTPHASELOEKEDLOOPPLLISONEOFTHEMOSTIMPORTANTPARTOFCURRENTSOCCHIPSANDINCREASINGLYUSEDINCOMMUNICATIONANDMICROPROCESSORSYSTEMS.WITHTHEIMPROVINGOFTHESESYSTEMS,MUCHMORESTRINGENTREQUIREMENTSHAVEBEENPLACEDONTHEDESIGNOFPLLSYSTEM.HOWEVER,TODESIGNAPLLISDIFFICULTANDWILLTAKEALONGTIMETOSIMULATION.ITHASBEENAPROBLEMINANALOGICDESIGN.INTHISTHESISAWHOLEPLLISDISCUSSEDINO,35URNRFCMOSPROCESS.ITWORKSAT3.3VWITHOUTPUTRANGEOF64MHZ一240MHZ.ITSSTEPIS4MHZ.INTHISDESIGN,ATOPDOWNDESIGNTECHNOLOGYISUSED,WHICHBEGINS、VITHSYSTEMDESIGN,DOWNTOLAYOUTDESIGN.FIRST,PLL’SBEHAVIORMODELISBUILDUPINVERILOGALANGUAGE,ANDTHEPARAMETEROFTHEFULLSYSTEMWASCHOSENANDOPTIMIZED.EVERYBLOCK’SSTRUCTUREISCHOSENACCORDINGTOTHEMODULEPARAMETER,ANDEVERYBLOCKISDESIGNEDANDSIMULATEDCAREFULLY.THENWHOLESYSTEMISANALYZEDUNDERDIFFERENTCONDITION.FROMTHESIMULATIONWECANCONCLUDETHATALLTHEMODULEANDPLLSYSTEMPASSEDTHEDESIGNREQUIREMENT.AFTERFINISHINGSIMULATING,EVERYBLOCK’SLAYOUTISFINISHEDANDTAPEDINCHARTERD.THETESTINGRESULTSINDICATETHEMODULETESTEDWORKSWELL,ACHIEVESDESIGNREQUIREMENTSBASICALLY.111ECHIPHASSOMEPRACTICALVALUE.KEYWORDSPLL,VCO,CHARGEPUMP,
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    • 簡介:天津大學碩士學位論文035微米BICMOS光刻工藝參數(shù)的優(yōu)化姓名白蘭萍申請學位級別碩士專業(yè)電子與通信工程指導教師張為程高龍20081101天津大學碩士學位論文ABSTRACTTHEIMPROVEMENTANDOPTIMIZATIONOFTHEPHOTOLITHOGRAPHYPROCESSFORATYPICALCMOSPRODUCTWASDISCUSSED.FORTHISPRODUCT,THREEMAINPROBLEMSWEREANALYZEDINDETAILANDGOTTHESOLUTIONFMALLY.THISPRODUCTALSOHASBEENIMPLEMENTMASSPRODUCTIONSUCCESSFULLY.THEFOLLOWINGWILLLISTTHETHREEPROBLEMS1.LENSHEATINGISSUEONPHOTOPROCESSTHISPRODUCTHASSEVERALLAYERSINFRONTENDWITHHI}GHMASKTRANSMISSIONRATEANDHIGHEXPOSUREDOSE,THUSCANEASILYCAUSELENSHEATINGISSUEONILINESCANNERT001.THISWILLLEADTOLENSDISTORTIONANDFOCUSDRIFT.THISPROBLEMWILLBEDISCUSSEDANDSOLVEDINTHISPAPER.2.THEBALLTYPEDEFECTISSUECAUSEDBYPHOTORESISTPOWDERINTHEPROCESSOFTHISPRODUCT,SOMELAYERSNEEDCOATTHINNERTHICKNESS.TOGETTHETHINNERTHICKNESS,WENEEDADJUSTCOATMAINRPMVERYHIGH.HOWEVER,HIGHSPEEDROTATIONMAKESTHERESISTMISTANDFLOATINGONCOATERUNIT,THENTHEEXHAUSTBLOWTHEPOWDEROUTANDFALLINTOTHENEXTWAFER.THEREFORE,THEWAFERONARMSWILLSUFFERBALLTYPEDEFECT.THEMETHODOFCONTROLHIGHRPMWILLBEFOUNDOUTANDHANDLETHISDEFECTINTHISPAPER.3.USETARCTOREMOVETHERESIDUEDEFECTWHICHISPRODUCEDINDEVELOPMENTPROCESSTHEDEFECTDURINGTHEDEVELOPMENTPROCESSISTHEMAINFACTORWHICHLEADSTOYIELDLOSS.SUCHASAVARIETYOFGENERATIONMECHANISMANDDIFFERENTCHARACTERISTICSOFPHOTORESISTRESIDUEDEFECTISAMAJORPROBLEMWHICHPLAGUESLITHOGRAPHYSECTOR.THISHASACLASSOFRESIDUESFROMTHEENHANCEMENTOFTHEPRODUCTREACTIONPROCESSRESIDUE.THERESIDUEISN’TEASYTOBEMOVEDBYRINSEPROCESS.THEREFORE,THERESIDUESONTHEWAFERSURFACECANLEADTOPAAERNFAIL.THESLASHDEFECTTHATISOCCURREDONDUVTOOLISATYPICALONE.INTHISPAPER,SLASHDEFECTSASANEXAMPLE,TOSTUDYITSPRINCIPLEANDSOLUTIONS.KEYWORDSBICMOS,MASK,DEFOCUS,BALLTYPEDEFECT,SLASHDEFECTⅡI
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      頁數(shù): 48
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    • 簡介:湖南大學碩士學位論文025ΜMCMOS工藝24GHZ低噪聲放大器及壓控振蕩器設計姓名鄧建元申請學位級別碩士專業(yè)微電子學與固體電子學指導教師謝中20050304ABSTRACTWITHTHEDEVELOPMENTOFTHETECHNOLOGYOFWIRELESSCOMMUNICATION,THEDREAMOFDATACOMMUNICATIONANYWHEREANDANYTIMEHASBEENREALIZEDPRIMARILY.ATTHESAMETIME,THEDEMANDHASBEENONAGREATUPSURGEFORHIGHERRATE,LARGERCAPABILITYANDHIGHERPERFORMANCEOFWIRELESSCOMMUNICATIONSYSTEMS.UNDERSUCHCIRCUMSTANCES,RESEARCHESINTHEFIELDOFRADIOANDWIRELESSCOMMUNICATIONICBECOMEMOREANDMOREACTIVE.NOWTHEREEXISTSEVERALKINDSOFWIRELESSDATACOMMUNICATIONSTANDARD,F(xiàn)OREXAMPLE,IN2.4GHZISMBANDTHEREARE802.11B/GSTANDARD,BLUETOOTHANDHOMERFETC.WITHTHEPROGRESSOFCMOSTECHNOLOGY,THECHARACTERISTICSIZEISSHRINKING,WHICHCANMEETTHEREQUIREMENTSOFSEVERALTENGHZRFIC.ATTHESAMETIME,THEIMPROVEMENTOFDEVICEMODEL,THEAPPEARANCEOFHIGHPERFORMANCEPASSIVEICDEVICEANDESPECIALLYTHEREALIZATIONOFINDUCTORSINCHIPMAKETHERFFRONTBACKFUNCTIONCIRCUITSINTEGRATINGINTOSINGLECHIPPOSSIBLE.SO,THECOMPETITIONABILITYOFCMOSTECHNOLOGYINRFICISLARGELYENHANCEDBYALLOFTHESEPROGRESSES.INTHISTHESISITISPRESENTEDTHATTHEDESIGNOFLNAANDVCOFOR1EEE802.1LB/GWLANRECEIVERINAO.25UMCMOSPROCESS.FORTHE2.4GHZRECEIVERTHERFISTUNABLEFROM2.4TO2.483GHZANDTHEIFIS480MHZ.THEINDUCTORANDCAPACITORINCMOSPROCESSISANIMPORTANTISSUEINDESIGNINGLNAANDVC0.THEMODELOFINDUCTORANDCAPACITORAREINTRODUCEDINTHEFIRST.WITHTHEHELPOFSOFTWAREASITIC,DIFFERENTKINDSOFINDUCTORSARESIMULATEDTOFITTHEREQUIREMENTOFTHEDESIGN.STARTINGFROMTHENOISEANALYSIS,THERELATIONSHIPOFTHENOISEFACTOROFCIRCUITANDTHEWIDTHOFMOSFETISDEDUCED,WHICHISQUITEIMPORTANTFORLNA.INTHEVCODESIGNING,THEMODELOFLINEARTIMEDEPENDENTNOISEISADOPTEDTOCALCULATETHEPHASENOISE.THEQUANTITATIVERELATIONSHIPOFPHASENOISEANDOTHERPARAMETERSISOBTAINED.TOSOLVETHECONTRADICTIONOFGAINANDTUNINGRANGEOFVCO,THESELFADJUSTEDDISCRETEVCOISINTRODUCED,BYWHICHTHEGAINANDPHASENOISEOFVCOCANBELARGELYDECREASEDINWIDETUNINGRANGE.TOREACHBETTERPERFORMANCEOFCIRCUIT,THEBIASCIRCUITOFBANDGAPREFERENCEISADOPTEDWHICHMAKESTHEBIASVOLTAGEANDCURRENTINDEPENDENTOFTHEPOWERSUPPLYANDTEMPERATURE.SEVERALKEYSIMULATIONRESULTSAREACHIEVEDINTHEWORKOFTHETHESISTHEVOLTAGECONTROLOSCILLATORVCOHASANOUTPUTFREQUENCYRANGEFROM1.8TO2.28GHZWITHII
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    • 簡介:目錄摘要..................................................1ABSTRACL?????........?????....??..2第一章前言..............................................3§1.1課題背景一半導體制造業(yè)的發(fā)展??????????????.3§1.2研究目的一開發(fā)并優(yōu)化新工藝的意義????????????.5§1.3論文結構?????????????????????????6第二章干法刻蝕回顧......................................7§2.1干法刻蝕原理??????????????????????.7§2.2側壁SPACER在工藝流程中的作用????????????.15第三章半導體中實驗設計DOE方法???????.16§3.1實驗設計DOE的原理和方法??????????????..16§3.2實驗檢測工具和分析工具?????????????????16第四章O.18微米側壁SPACER刻蝕工藝的開發(fā)和優(yōu)化.??..19§4.1O.18微米側壁SPACER工藝概述??????????????19§4.20.18微米側壁SPACER現(xiàn)有工藝存在的問題????????.19§4.3在DPSPLUS設備上的工藝優(yōu)化???????????????..22§4.3.1使用新工藝氣體SF6進行工藝開發(fā)??????????.22§4.3.2改變硅片背面氦氣壓力進行工藝優(yōu)化?????????~38§4.3.3改變工藝氣體CF4的組成進行工藝優(yōu)化????????..42第五章結論????????????.??..63參考文獻????????????????66致謝?????????????????67ABSTRACTTHISTHESISMAINLYFOCUSESONTHEDEVELOPMENTOFAREETCHINGPROCESSFOR0.18URNSPACER.IMPROVINGPREVIOUSDRYETCHINGPROCESS,WESUCCESSFULLYDEVELOPEDNEWETCHPROCESSBYTAKINGUSEOFOURCOMPANY’SCURRENTMACHINESANDLOCALRESOURCEACCORDINGTO0.18UMSPACERETCHHAVESMALLFOOTINDENSELINE,WEDISCOVEREDSOMEPROBLEMSBASINGOLLEXISTINGMACHINESANDPROCESSTECHNOLOGY.THEMAINPROBLEMSALETHELOWETCHRATESELECTIVITYCAUSINGOVERETCHONTHETOPOXIDEOFGATEANDTHELOWETCHRATEUNIFORMITYCAUSINGSPACERPROFILETAPEREDANDCDSMALLER.SOWEDOIMPROVEMENTMAINLYINTHREEAPPROACHESASFOLLOWSFIRSTLY,WEUSEDPSPLUSTOOLINSTEADOFDPSTOOLINORDERTOINCREASENEWETCHINGGASSF6.AFTERWARDSWEIMPROVEETCHRATESELECTIVITY,UNIFORMITYANDALSOIMPROVEPROFILE,CDOFSPACERBUTONTHEGATE,SOMENITRIDEREMAINEDSECONDLY,WECHANGEDBACKSIDEHELIUMPRESSURETOIMPROVEETCHRATEUNIFORMITY.FUNHENNORCWEOBSERVEDTHETHICKNESSOFOXIDEREMAINED,BUTONTHEGATE,SOMENITRIDESTILLREMAINED.FINALLY,BYADJUSTTHEGASFLOWRATIOOFCF4ANDCHF3,WEDEVELOPEDSOMENEWETCHRECIPESWHICHHASHIGHETCHRATEUNIFORMITYANDSELECTIVITYOFOXIDETONITRIDESOTHATNONITRIDEREMAINEDONTHEGATE.FROMDESIGNOFEXPERIMENTDOEDATA’WEGOTTHEPROCESSBOUNDARYFORTHESPACERETCHONDPSPLUS.WEDIDELECTRICALTESTSANDTHERESUITSCONFIRMEDTHATTHENEWPROCESSDEVELOPEDINTHISTHESISCAILMEETTHEPRODUCTREQUIREMENTS.KEYWORDSDRYETCH;SPACER;ETCHRATESELECTIVITY;BACKSIDEHELIUM;ETCHRATEUNIFORMITY;MAINETCH;OVERETCHCLASSIFICATIONCODETN42
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